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鐳射干涉儀
DynaFiz®
Verifire™系列
大光圈鐳射干涉儀
多種波長可供選擇
干涉儀附件
產品升級套件
典型干涉儀配置
MetroPro®軟體介紹
抗振型鐳射干涉儀
3D表面輪廓量測儀 ZeGage™ ZeGage™ Plus NewView™ 8000系列 Nexview™ 3D 表面輪廓儀主要應用 |
ZeGage™ Plus 3D Optical Surface Profiler with Sub-Nanometer Precision![]() ![]() Mx™軟體螢幕(點擊圖像來放大)
Key Features:
More than 20X better surface topography repeatability over standard ZeGage. Up to 2X faster vertical scan rate over standard ZeGage. Measures virtually all surfaces from rough to super-smooth. Vibration-resistant, for production floor metrology and process control. The ZeGage Plus optical profiler expands on the capabilities of the ZeGage profiler with higher precision, faster measurement speed, and an increased range of measurable surfaces – while preserving its ease of use, vibration insensitivity, and small footprint. The ZeGage Plus profiler can measure a wider variety of surfaces – ranging from very rough to super smooth, with sub-nanometer precision, independent of field of view. Surface finishes may include ground, honed, lapped, polished, and super-polished on materials such as glass, ceramic, and metal. For high-speed form measurements, the ZeGage Plus scans up to twice as fast as the ZeGage, providing faster time-to-data and increased throughput for production metrology. As with the ZeGage profiler, the interactive control software, Mx™, provides easy and detailed visualization to help you control your process. Read more to see how the power, versatility, and value of the ZeGage Plus profiler can benefit you.
Powerful Performance
Versatility
Productivity and Value
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